Assignee
SERIKAWA SHIGERU
JP·1 granted patent·3 pending applications·3 citations·filing 2007–2011
Top patents by PatentIndex Score
4 records- 0167US8781758B2Optical inspection method and its apparatusSERIKAWA SHIGERU·Filed 2011·Granted Jul 15, 2014·3 cites·14 claims
- 0244US2008080346A1Detection method of peripheral surface defect of disk and detection device thereofSERIKAWA SHIGERU·Filed 2007·Application pending·0 cites
- 0342US2008088830A1Optical system of detecting peripheral surface defect of glass disk and device of detecting peripheral surface defect thereofSERIKAWA SHIGERU·Filed 2007·Application pending·0 cites
- 0441US2007222975A1Testing method for surface defects on disc and testing apparatus for the sameSERIKAWA SHIGERU·Filed 2007·Application pending·0 cites
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