Assignee
SEURING MARKUS
DE·2 granted patents·1 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0157US9885752B2Test apparatus for generating reference scan chain test data and test systemSEURING MARKUS·Filed 2010·Granted Feb 6, 2018·1 cites·21 claims
- 0226US8307249B2At-speed bitmapping in a memory built-in self-test by locking an N-TH failureSEURING MARKUS·Filed 2010·Granted Nov 6, 2012·0 cites·23 claims
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