Assignee
SHIMAKURA TOMOKAZU
JP·2 granted patents·1 pending application·2 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0162US8766185B2Charged particle beam deviceSHIMAKURA TOMOKAZU·Filed 2010·Granted Jul 1, 2014·2 cites·15 claims
- 0241US2007057666A1Defect inspection system and method for recording mediaSHIMAKURA TOMOKAZU·Filed 2006·Application pending·0 cites
- 0340US8410438B2Charged particle beam deviceSHIMAKURA TOMOKAZU·Filed 2011·Granted Apr 2, 2013·0 cites·12 claims
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