Assignee
SHIMURA KEI
JP·6 granted patents·1 pending application·31 citations·filing 2006–2012
Top patents by PatentIndex Score
7 records- 0190US8126259B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2010·Granted Feb 28, 2012·12 cites·2 claims
- 0283US8131058B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2006·Granted Mar 6, 2012·11 cites·2 claims
- 0373US8879821B2Defect inspecting device and defect inspecting methodSHIMURA KEI·Filed 2010·Granted Nov 4, 2014·2 cites·18 claims
- 0469US8472697B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2012·Granted Jun 25, 2013·2 cites·3 claims
- 0563US9851548B2Optical microscope device and testing apparatus comprising sameSHIMURA KEI·Filed 2012·Granted Dec 26, 2017·2 cites·7 claims
- 0661US8194969B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2010·Granted Jun 5, 2012·2 cites·16 claims
- 0739US2013088590A1Far infrared imaging device and imaging method using sameSHIMURA KEI·Filed 2011·Application pending·0 cites
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