Assignee
SHIN ETSU HANDATAI CO LTD
JP·2 granted patents·27 citations·filing 1977–1992
Top patents by PatentIndex Score
2 records- 0169US4243473AMethod for detecting crystal defects in semiconductor silicon and detecting solution thereforSHIN ETSU HANDATAI CO LTD·Filed 1977·Granted Jan 6, 1981·20 cites·2 claims
- 0236US5401684AMethod of manufacturing a light-emitting semiconductor device substrateSHIN ETSU HANDATAI CO LTD·Filed 1992·Granted Mar 28, 1995·7 cites·2 claims
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