Assignee
SHIN JI-YOUNG
KR·1 granted patent·2 pending applications·0 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0145US8546154B2Apparatus and method to inspect defect of semiconductor deviceSHIN JI-YOUNG·Filed 2011·Granted Oct 1, 2013·0 cites·9 claims
- 0238US2007028771A1Adsorption apparatus, semiconductor device manufacturing facility comprising the same, and method of recycling perfulorocompoundsSHIN JI-YOUNG·Filed 2006·Application pending·0 cites
- 0338US2008093596A1Semiconductor Device and Method of Fabricating the SameSHIN JI-YOUNG·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when SHIN JI-YOUNG files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →