Assignee
SHINOHARA HIROSHI
JP·2 granted patents·3 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0163US8692311B2Method for manufacturing semiconductor deviceSHINOHARA HIROSHI·Filed 2011·Granted Apr 8, 2014·2 cites·17 claims
- 0263US8482779B2Reducing redundancy of processing by acquiring image correction or a parameter that has been already performed at another apparatusSHINOHARA HIROSHI·Filed 2010·Granted Jul 9, 2013·1 cites·9 claims
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