Assignee
SISCAN SYSTEMS INC
US·5 granted patents·226 citations·filing 1985–1991
Top patents by PatentIndex Score
5 records- 0187US4748335AMethod and aparatus for determining surface profilesSISCAN SYSTEMS INC·Filed 1985·Granted May 31, 1988·70 cites·42 claims
- 0285US5184021AMethod and apparatus for measuring the dimensions of patterned features on a lithographic photomaskSISCAN SYSTEMS INC·Filed 1991·Granted Feb 2, 1993·53 cites·18 claims
- 0384US4707610AMethod and apparatus for measuring surface profilesSISCAN SYSTEMS INC·Filed 1986·Granted Nov 17, 1987·45 cites·23 claims
- 0479US4634880AConfocal optical imaging system with improved signal-to-noise ratioSISCAN SYSTEMS INC·Filed 1986·Granted Jan 6, 1987·45 cites·8 claims
- 0562US4847823AMethod and apparatus for reading or measuring magneto-optical storage media using pinhole apertureSISCAN SYSTEMS INC·Filed 1987·Granted Jul 11, 1989·13 cites·12 claims
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