Assignee

SPRONG HANS PETER

NL·1 granted patent·13 citations·filing 2011–2011

Technology mixA61B1 H01J1 H05G1

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0170US9370084B2Determining changes in the x-ray emission yield of an x-ray sourceSPRONG HANS PETER·Filed 2011·Granted Jun 14, 2016·13 cites·22 claims

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