Assignee
STRAAIJER ALEXANDER
NL·5 granted patents·1 pending application·336 citations·filing 2008–2013
Top patents by PatentIndex Score
6 records- 0199US8797554B2Determining a structural parameter and correcting an asymmetry propertySTRAAIJER ALEXANDER·Filed 2013·Granted Aug 5, 2014·83 cites·23 claims
- 0299US8692994B2Inspection method and apparatus, and associated computer readable productSTRAAIJER ALEXANDER·Filed 2011·Granted Apr 8, 2014·61 cites·18 claims
- 0398US8792096B2Inspection apparatus for lithographySTRAAIJER ALEXANDER·Filed 2009·Granted Jul 29, 2014·63 cites·23 claims
- 0498US8681312B2Inspection apparatus for lithographySTRAAIJER ALEXANDER·Filed 2009·Granted Mar 25, 2014·62 cites·20 claims
- 0598US8115926B2Inspection method and apparatus, lithographic apparatus, lithographic processing cell, and device manufacturing method to measure a property of a substrateSTRAAIJER ALEXANDER·Filed 2008·Granted Feb 14, 2012·67 cites·25 claims
- 0642US2013162996A1Inspection Method and Apparatus, and Lithographic ApparatusSTRAAIJER ALEXANDER·Filed 2012·Application pending·0 cites
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