Assignee
STROESSNER ULRICH
DE·3 granted patents·9 citations·filing 2009–2009
Top patents by PatentIndex Score
3 records- 0177US8736849B2Method and apparatus for measuring structures on photolithography masksSTROESSNER ULRICH·Filed 2009·Granted May 27, 2014·5 cites·33 claims
- 0272US8718354B2Method for analyzing masks for photolithographySTROESSNER ULRICH·Filed 2009·Granted May 6, 2014·4 cites·20 claims
- 0344US9116447B2Microscope for reticle inspection with variable illumination settingsSTROESSNER ULRICH·Filed 2009·Granted Aug 25, 2015·0 cites·22 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →