Assignee
SURFACE MEASUREMENT SYSTEMS LT
GB·2 granted patents·13 citations·filing 1999–2001
Top patents by PatentIndex Score
2 records- 0140US6490910B1Apparatus and a method for investigating the properties of a solid material by inverse chromatographySURFACE MEASUREMENT SYSTEMS LT·Filed 1999·Granted Dec 10, 2002·13 cites·33 claims
- 0228US7160718B2Controlled sample environment for analytical devicesSURFACE MEASUREMENT SYSTEMS LT·Filed 2001·Granted Jan 9, 2007·0 cites·20 claims
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