Assignee
SYSTEM SQUARE INC
JP·6 granted patents·1 pending application·34 citations·filing 2013–2021
Top patents by PatentIndex Score
7 records- 0196US9865424B2X-ray inspection systemSYSTEM SQUARE INC·Filed 2015·Granted Jan 9, 2018·24 cites·8 claims
- 0286US9541499B2Package inspection systemSYSTEM SQUARE INC·Filed 2015·Granted Jan 10, 2017·3 cites·12 claims
- 0382US10859516B2X-ray inspection apparatusSYSTEM SQUARE INC·Filed 2017·Granted Dec 8, 2020·3 cites·5 claims
- 0478US9733384B2Package inspection systemSYSTEM SQUARE INC·Filed 2013·Granted Aug 15, 2017·4 cites·9 claims
- 0542US12430739B2Training data generation device, inspection device and programSYSTEM SQUARE INC·Filed 2021·Granted Sep 30, 2025·0 cites·5 claims
- 0640US2020241150A1Electromagnetic wave detection module, electromagnetic wave detection module array, and non-destructive inspection apparatusSYSTEM SQUARE INC·Filed 2017·Application pending·0 cites
- 0735US12361094B2Training data generation device and training data generation programSYSTEM SQUARE INC·Filed 2019·Granted Jul 15, 2025·0 cites·5 claims
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