Assignee
SYSTEMS ON SILICON MFG CO PTE
SG·16 granted patents·4 pending applications·37 citations·filing 2003–2007
Top patents by PatentIndex Score
20 records- 0170US7772590B2Metal comb structures, methods for their fabrication and failure analysisSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Aug 10, 2010·7 cites·6 claims
- 0261US7394280B1Method of electro migration testingSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Jul 1, 2008·7 cites·8 claims
- 0355US7355173B2Delineation of wafersSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted Apr 8, 2008·1 cites·14 claims
- 0453US7208965B2Planar view TEM sample preparation from circuit layer structuresSYSTEMS ON SILICON MFG CO PTE·Filed 2004·Granted Apr 24, 2007·5 cites·10 claims
- 0552US7778798B2System and method for measuring tool performanceSYSTEMS ON SILICON MFG CO PTE·Filed 2006·Granted Aug 17, 2010·4 cites·23 claims
- 0650US2007095786A1Selective reactive ion etching of wafersSYSTEMS ON SILICON MFG CO PTE·Filed 2006·Application pending·0 cites
- 0743US7351990B2Analyzer magnet chamber linerSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted Apr 1, 2008·2 cites·15 claims
- 0841US2007262030A1Cmp Slurry StrainerSYSTEMS ON SILICON MFG CO PTE·Filed 2003·Application pending·0 cites
- 0940US2009146222A1Method for fabrication of single electron transistorsSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Application pending·0 cites
- 1037US7272760B2Curve tracing device and methodSYSTEMS ON SILICON MFG CO PTE·Filed 2004·Granted Sep 18, 2007·5 cites·9 claims
- 1136US7693667B2Method and system for determining a predicted flash endurance Vt of a flash cell after N program/erase cyclesSYSTEMS ON SILICON MFG CO PTE·Filed 2006·Granted Apr 6, 2010·1 cites·11 claims
- 1236US7663743B2Sensing systemSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Feb 16, 2010·0 cites·36 claims
- 1336US7201642B2Process for producing improved membranesSYSTEMS ON SILICON MFG CO PTE·Filed 2004·Granted Apr 10, 2007·3 cites·13 claims
- 1434US7247084B2Polishing head elbow fittingSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted Jul 24, 2007·0 cites·19 claims
- 1532US7400391B2System and method for detection of spatial signature yield lossSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Jul 15, 2008·0 cites·20 claims
- 1630US7230439B2Method for detecting and monitoring wafer probing process instabilitySYSTEMS ON SILICON MFG CO PTE·Filed 2003·Granted Jun 12, 2007·2 cites·18 claims
- 1730US7211450B2System and method for detection of spatial signature yield lossSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted May 1, 2007·0 cites·12 claims
- 1828US2007258505A1Apparatus for thermocouple setting and flat zone procedure in a furnaceSYSTEMS ON SILICON MFG CO PTE·Filed 2006·Application pending·0 cites
- 1923US7642798B2Probe card needle cleaning frequency optimizationSYSTEMS ON SILICON MFG CO PTE·Filed 2003·Granted Jan 5, 2010·0 cites·34 claims
- 2023US7208363B2Fabrication of local interconnect linesSYSTEMS ON SILICON MFG CO PTE·Filed 2005·Granted Apr 24, 2007·0 cites·21 claims
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