Assignee
TABATABAEI SASSAN
4 granted patents·16 citations·filing 2008–2010
Top patents by PatentIndex Score
4 records- 0189US8225156B1Methods and apparatuses for external voltage test methodology of input-output circuitsTABATABAEI SASSAN·Filed 2010·Granted Jul 17, 2012·5 cites·20 claims
- 0277US7941287B2Periodic jitter (PJ) measurement methodologyTABATABAEI SASSAN·Filed 2008·Granted May 10, 2011·6 cites·3 claims
- 0375US8064293B2High resolution time interpolatorTABATABAEI SASSAN·Filed 2010·Granted Nov 22, 2011·3 cites·7 claims
- 0455US8255188B2Fast low frequency jitter rejection methodologyTABATABAEI SASSAN·Filed 2008·Granted Aug 28, 2012·2 cites·18 claims
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