Assignee
TAGUCHI JUNICHI
JP·2 granted patents·12 citations·filing 2008–2009
Top patents by PatentIndex Score
2 records- 0169US8131059B2Defect inspection device and defect inspection method for inspecting whether a product has defectsTAGUCHI JUNICHI·Filed 2008·Granted Mar 6, 2012·6 cites·3 claims
- 0264US8285056B2Method and apparatus for computing degree of matchingTAGUCHI JUNICHI·Filed 2009·Granted Oct 9, 2012·6 cites·21 claims
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