Assignee
TAILLIET FRANCOIS
FR·12 granted patents·314 citations·filing 2009–2012
Top patents by PatentIndex Score
12 records- 0198US8509318B2Multiple-channel transmission over a single-wire busTAILLIET FRANCOIS·Filed 2009·Granted Aug 13, 2013·303 cites·31 claims
- 0275US8994022B2Method of evaluating a semiconductor wafer dicing processTAILLIET FRANCOIS·Filed 2012·Granted Mar 31, 2015·3 cites·20 claims
- 0373US8405942B2Integrated circuit provided with a protection against electrostatic dischargesTAILLIET FRANCOIS·Filed 2011·Granted Mar 26, 2013·3 cites·4 claims
- 0471US8792262B2Nonvolatile memory with bitline capacitive coupling compensationTAILLIET FRANCOIS·Filed 2012·Granted Jul 29, 2014·4 cites·17 claims
- 0553US8310879B2Method of programming an electrically programmable and erasable non-volatile memory point, and corresponding memory deviceTAILLIET FRANCOIS·Filed 2010·Granted Nov 13, 2012·1 cites·32 claims
- 0649US8802455B2Security-protection of a wafer of electronic circuitsTAILLIET FRANCOIS·Filed 2012·Granted Aug 12, 2014·0 cites·31 claims
- 0745US8667185B2Method and device for communication between a master and a number of slaves according to a serial communication protocol, in particular of the open drain typeTAILLIET FRANCOIS·Filed 2011·Granted Mar 4, 2014·0 cites·26 claims
- 0841US8717820B2Floating addressing of an EEPROM memory pageTAILLIET FRANCOIS·Filed 2012·Granted May 6, 2014·0 cites·15 claims
- 0940US8228732B2EEPROM memory protected against the effects of breakdown of MOS transistorsTAILLIET FRANCOIS·Filed 2009·Granted Jul 24, 2012·0 cites·20 claims
- 1038US9001602B2Method of burn-in test of EEPROM or flash memoriesTAILLIET FRANCOIS·Filed 2012·Granted Apr 7, 2015·0 cites·20 claims
- 1137US8891310B2EEPROM memory protected against breakdown of control gate transistorsTAILLIET FRANCOIS·Filed 2012·Granted Nov 18, 2014·0 cites·20 claims
- 1235US8572351B2Memory device with serial protocol and corresponding method of addressingTAILLIET FRANCOIS·Filed 2010·Granted Oct 29, 2013·0 cites·37 claims
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