Assignee
TAIWAN ELECTRON MICROSCOPE INSTR CORPORATION
TW·3 granted patents·1 citations·filing 2018–2022
Top patents by PatentIndex Score
3 records- 0159US10607808B2Examination container and electron microscopeTAIWAN ELECTRON MICROSCOPE INSTR CORPORATION·Filed 2018·Granted Mar 31, 2020·1 cites·25 claims
- 0255US12022598B2Detection and charge neutralization device and method thereofTAIWAN ELECTRON MICROSCOPE INSTR CORPORATION·Filed 2022·Granted Jun 25, 2024·0 cites·13 claims
- 0340US10593513B2Membrane assembly, examination container and electron microscopeTAIWAN ELECTRON MICROSCOPE INSTR CORPORATION·Filed 2018·Granted Mar 17, 2020·0 cites·22 claims
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