Assignee
TAKAGI YUJI
JP·5 granted patents·3 pending applications·13 citations·filing 2003–2012
Top patents by PatentIndex Score
8 records- 0184US9390490B2Method and device for testing defect using SEMTAKAGI YUJI·Filed 2010·Granted Jul 12, 2016·7 cites·5 claims
- 0270US9153020B2Semiconductor device defect inspection method and system thereofTAKAGI YUJI·Filed 2012·Granted Oct 6, 2015·2 cites·12 claims
- 0365US8556547B2Radius end millTAKAGI YUJI·Filed 2010·Granted Oct 15, 2013·4 cites·2 claims
- 0450US2010188721A1Two-dimensional encoder, holographic memory device and holographic memory mediumTAKAGI YUJI·Filed 2007·Application pending·0 cites
- 0543US2004112454A1Metallic tubular hoseTAKAGI YUJI·Filed 2003·Application pending·0 cites
- 0642US2014198629A1Storage device and storage methodTAKAGI YUJI·Filed 2012·Application pending·0 cites
- 0740US8621400B2Method of evaluating systematic defect, and apparatus thereforTAKAGI YUJI·Filed 2011·Granted Dec 31, 2013·0 cites·12 claims
- 0837US8675949B2Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review toolTAKAGI YUJI·Filed 2010·Granted Mar 18, 2014·0 cites·18 claims
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