Assignee
TAKAHASHI MASANORI
JP·11 granted patents·9 pending applications·10 citations·filing 2005–2012
Top patents by PatentIndex Score
20 records- 0176US8656969B2Pneumatic tireTAKAHASHI MASANORI·Filed 2009·Granted Feb 25, 2014·4 cites·12 claims
- 0275US8614879B2Solid electrolytic capacitor and its manufacturing methodTAKAHASHI MASANORI·Filed 2011·Granted Dec 24, 2013·2 cites·4 claims
- 0366US8171433B2Method of calculating pattern-failure-occurrence-region, computer program product, pattern-layout evaluating method, and semiconductor-device manufacturing methodTAKAHASHI MASANORI·Filed 2009·Granted May 1, 2012·3 cites·20 claims
- 0461US8710642B2Semiconductor device, method of manufacturing semiconductor device, and electronic apparatusTAKAHASHI MASANORI·Filed 2012·Granted Apr 29, 2014·1 cites·7 claims
- 0550US8318393B2Optical-image-intensity calculating method, pattern generating method, and manufacturing method of semiconductor deviceTAKAHASHI MASANORI·Filed 2010·Granted Nov 27, 2012·0 cites·20 claims
- 0648US9048024B2Solid electrolytic capacitor and method for producing the sameTAKAHASHI MASANORI·Filed 2012·Granted Jun 2, 2015·0 cites·3 claims
- 0748US8068663B2Simulation method of optical image intensity distribution, program, and method of manufacturing semiconductor deviceTAKAHASHI MASANORI·Filed 2008·Granted Nov 29, 2011·0 cites·6 claims
- 0848US2010081295A1Process model evaluation method, process model generation method and process model evaluation programTAKAHASHI MASANORI·Filed 2009·Application pending·0 cites
- 0947US8559009B2Image calculation methodTAKAHASHI MASANORI·Filed 2011·Granted Oct 15, 2013·0 cites·20 claims
- 1046US2010008562A1Latent image intensity distribution evaluation method, method of manufacturing the semiconductor device and latent image intensity distribution evaluation programTAKAHASHI MASANORI·Filed 2009·Application pending·0 cites
- 1145US8107224B2Thin solid electrolytic capacitor having high resistance to thermal stressTAKAHASHI MASANORI·Filed 2008·Granted Jan 31, 2012·0 cites·27 claims
- 1245US2006130976A1Thermal activation apparatus and printer including the sameTAKAHASHI MASANORI·Filed 2005·Application pending·0 cites
- 1341US2011238196A1Method for simulating electromagnetic field, electromagnetic field simulation apparatus and method for manufacturing semiconductor deviceTAKAHASHI MASANORI·Filed 2011·Application pending·0 cites
- 1440US2012195560A1Optical fiber moduleTAKAHASHI MASANORI·Filed 2012·Application pending·0 cites
- 1539US2006144369A1EngineTAKAHASHI MASANORI·Filed 2005·Application pending·0 cites
- 1638US8654313B2Exposing method and method of manufacturing semiconductor deviceTAKAHASHI MASANORI·Filed 2010·Granted Feb 18, 2014·0 cites·2 claims
- 1738US2006130975A1Thermal activation apparatus and printer including the sameTAKAHASHI MASANORI·Filed 2005·Application pending·0 cites
- 1837US8610751B2Thermal printerTAKAHASHI MASANORI·Filed 2010·Granted Dec 17, 2013·0 cites·20 claims
- 1936US2011128341A1Thermal printerTAKAHASHI MASANORI·Filed 2010·Application pending·0 cites
- 2031US2010261121A1Pattern forming methodTAKAHASHI MASANORI·Filed 2010·Application pending·0 cites
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