Assignee
TAKAOKA OSAMU
JP·2 granted patents·4 pending applications·2 citations·filing 2007–2012
Top patents by PatentIndex Score
6 records- 0164US8815474B2Photomask defect correcting method and deviceTAKAOKA OSAMU·Filed 2012·Granted Aug 26, 2014·1 cites·10 claims
- 0263US8257887B2Photomask defect correcting method and deviceTAKAOKA OSAMU·Filed 2008·Granted Sep 4, 2012·1 cites·18 claims
- 0348US2008191372A1Mold inspecting method and resin residue removing method of nanoimprint lithographyTAKAOKA OSAMU·Filed 2008·Application pending·0 cites
- 0442US2008131792A1Method of Correcting Photomask DefectTAKAOKA OSAMU·Filed 2007·Application pending·0 cites
- 0541US2008107975A1Method of Correcting Photomask DefectTAKAOKA OSAMU·Filed 2007·Application pending·0 cites
- 0640US2008073522A1Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been usedTAKAOKA OSAMU·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when TAKAOKA OSAMU files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →