Assignee
TAKEKOSHI KIYOSHI
JP·3 granted patents·17 citations·filing 2003–2007
Top patents by PatentIndex Score
3 records- 0169US8101436B2Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive filmTAKEKOSHI KIYOSHI·Filed 2003·Granted Jan 24, 2012·13 cites·8 claims
- 0267US8456186B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodTAKEKOSHI KIYOSHI·Filed 2007·Granted Jun 4, 2013·2 cites·23 claims
- 0364US8120372B2Probe card for inspecting light receiving deviceTAKEKOSHI KIYOSHI·Filed 2007·Granted Feb 21, 2012·2 cites·4 claims
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