Assignee
TANAKA RYOHEI
US·5 granted patents·11 citations·filing 2011–2011
Top patents by PatentIndex Score
5 records- 0178US8686711B2High-frequency measuring device and high-frequency measuring device calibration methodTANAKA RYOHEI·Filed 2011·Granted Apr 1, 2014·5 cites·16 claims
- 0276US8510071B2High-frequency measuring device and high-frequency measuring device calibration methodTANAKA RYOHEI·Filed 2011·Granted Aug 13, 2013·4 cites·10 claims
- 0366US8738314B2High frequency measurement apparatus and calibration method for high frequency measurement apparatusTANAKA RYOHEI·Filed 2011·Granted May 27, 2014·2 cites·8 claims
- 0447US9372248B2Method for evaluating reliability of electrical power measuring deviceTANAKA RYOHEI·Filed 2011·Granted Jun 21, 2016·0 cites·5 claims
- 0541US8775190B2Voice-operated control circuit and method for using sameTANAKA RYOHEI·Filed 2011·Granted Jul 8, 2014·0 cites·33 claims
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