Assignee
TANWAR KUNALJEET
US·2 granted patents·50 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0195US8586473B1Methods for fabricating integrated circuits with ruthenium-lined copperTANWAR KUNALJEET·Filed 2012·Granted Nov 19, 2013·45 cites·20 claims
- 0276US8669176B1BEOL integration scheme for copper CMP to prevent dendrite formationTANWAR KUNALJEET·Filed 2012·Granted Mar 11, 2014·5 cites·23 claims
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