Assignee
TASMIT INC
JP·10 granted patents·4 pending applications·10 citations·filing 2018–2022
Top patents by PatentIndex Score
14 records- 0184US11380513B2Autofocus method for a scanning electron microscopeTASMIT INC·Filed 2019·Granted Jul 5, 2022·3 cites·8 claims
- 0281US10614999B2Image generation methodTASMIT INC·Filed 2018·Granted Apr 7, 2020·3 cites·2 claims
- 0373US10802073B2Pattern defect detection methodTASMIT INC·Filed 2018·Granted Oct 13, 2020·4 cites·4 claims
- 0460US12243237B2Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detectionTASMIT INC·Filed 2020·Granted Mar 4, 2025·0 cites·30 claims
- 0554US12347642B2Scanning electron microscopeTASMIT INC·Filed 2021·Granted Jul 1, 2025·0 cites·12 claims
- 0651US11468555B2Method and apparatus for generating a correction line indicating relationship between deviation of an edge of a wafer pattern from an edge of a reference pattern and space width of the reference pattern, and a computer-readable recording mediumTASMIT INC·Filed 2019·Granted Oct 11, 2022·0 cites·2 claims
- 0750US11322332B2Apparatus and method for measuring energy spectrum of backscattered electronsTASMIT INC·Filed 2019·Granted May 3, 2022·0 cites·11 claims
- 0846US12387341B2Pattern matching methodTASMIT INC·Filed 2021·Granted Aug 12, 2025·0 cites·10 claims
- 0946US2022012404A1Image matching method and arithmetic system for performing image matching processTASMIT INC·Filed 2019·Application pending·0 cites
- 1045US2023186459A1Pattern measuring methodTASMIT INC·Filed 2021·Application pending·0 cites
- 1144US2024171865A1Method of generating an image of a pattern on a workpieceTASMIT INC·Filed 2022·Application pending·0 cites
- 1237US12555220B2Pattern defect detection methodTASMIT INC·Filed 2021·Granted Feb 17, 2026·0 cites·8 claims
- 1331US2022180041A1Image generation methodTASMIT INC·Filed 2020·Application pending·0 cites
- 1427US11436736B2Pattern edge detection methodTASMIT INC·Filed 2019·Granted Sep 6, 2022·0 cites·7 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →