Assignee
TAU METRIX INC
US·10 granted patents·1 pending application·477 citations·filing 2004–2014
Top patents by PatentIndex Score
11 records- 0198US8344745B2Test structures for evaluating a fabrication of a die or a waferTAU METRIX INC·Filed 2006·Granted Jan 1, 2013·90 cites·16 claims
- 0298US7736916B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2007·Granted Jun 15, 2010·97 cites·11 claims
- 0397US7256055B2System and apparatus for using test structures inside of a chip during the fabrication of the chipTAU METRIX INC·Filed 2004·Granted Aug 14, 2007·134 cites·31 claims
- 0495US7423288B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2007·Granted Sep 9, 2008·26 cites·40 claims
- 0594US7605597B2Intra-chip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2007·Granted Oct 20, 2009·18 cites·10 claims
- 0694US7220990B2Technique for evaluating a fabrication of a die and waferTAU METRIX INC·Filed 2004·Granted May 22, 2007·59 cites·59 claims
- 0788US7730434B2Contactless technique for evaluating a fabrication of a waferTAU METRIX INC·Filed 2004·Granted Jun 1, 2010·24 cites·57 claims
- 0888US7339388B2Intra-clip power and test signal generation for use with test structures on wafersTAU METRIX INC·Filed 2004·Granted Mar 4, 2008·25 cites·26 claims
- 0982US7723724B2System for using test structures to evaluate a fabrication of a waferTAU METRIX INC·Filed 2008·Granted May 25, 2010·4 cites·10 claims
- 1071US2016104812A1Integrated photodiode for semiconductor substratesTAU METRIX INC·Filed 2014·Application pending·0 cites
- 1166US8872297B2Integrated photodiode for semiconductor substratesTAU METRIX INC·Filed 2013·Granted Oct 28, 2014·0 cites·29 claims
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