Assignee
TECAT TECH SUZHOU LIMITED
CN·14 granted patents·8 pending applications·3 citations·filing 2019–2023
Top patents by PatentIndex Score
22 records- 0187US11293975B2Probing deviceTECAT TECH SUZHOU LIMITED·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 0286US11761984B2Probe card device and testing equipment thereofTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Sep 19, 2023·1 cites·21 claims
- 0367US11768223B2Testing device and probe elements thereofTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Sep 26, 2023·0 cites·14 claims
- 0466US12467951B2Probe deviceTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Nov 11, 2025·0 cites·9 claims
- 0566US11549968B2Probing systemTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 0664US11262400B2Shielding for probing systemTECAT TECH SUZHOU LIMITED·Filed 2020·Granted Mar 1, 2022·0 cites·19 claims
- 0762US11567104B2High speed signal transmitting and receiving detection deviceTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Jan 31, 2023·0 cites·10 claims
- 0860US12504443B2Probe card structure including probe sets with different lengthsTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Dec 23, 2025·0 cites·9 claims
- 0959US12467954B2Probe card deviceTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Nov 11, 2025·0 cites·13 claims
- 1058US12163980B2Probe and elastic structure thereofTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Dec 10, 2024·0 cites·15 claims
- 1157US11879913B2Probe card structureTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Jan 23, 2024·0 cites·8 claims
- 1257US2024430005A1Optical signal processing device and optical signal measurement methodTECAT TECH SUZHOU LIMITED·Filed 2023·Application pending·0 cites
- 1357US2025004013A1Probe card structureTECAT TECH SUZHOU LIMITED·Filed 2023·Application pending·0 cites
- 1456US11804417B2Semiconductor structure comprising heat dissipation memberTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Oct 31, 2023·0 cites·10 claims
- 1553US12117484B2Test deviceTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Oct 15, 2024·0 cites·17 claims
- 1651US11965912B2Probe card device having a probe structure with a protrusion portionTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Apr 23, 2024·0 cites·7 claims
- 1750US2022397587A1Elastic probe element, elastic probe assembly, and testing deviceTECAT TECH SUZHOU LIMITED·Filed 2022·Application pending·0 cites
- 1848US2023036268A1Probe and probe card deviceTECAT TECH SUZHOU LIMITED·Filed 2021·Application pending·0 cites
- 1947US2022221490A1Test probe moduleTECAT TECH SUZHOU LIMITED·Filed 2021·Application pending·0 cites
- 2047US2022221491A1Probe card deviceTECAT TECH SUZHOU LIMITED·Filed 2021·Application pending·0 cites
- 2146US2021173003A1Probe apparatusTECAT TECH SUZHOU LIMITED·Filed 2019·Application pending·0 cites
- 2243US2021208182A1Probe card, probing system and probing methodTECAT TECH SUZHOU LIMITED·Filed 2020·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →