Assignee
TESCAN BRNO S R O
CZ·10 granted patents·3 pending applications·3 citations·filing 2016–2021
Top patents by PatentIndex Score
13 records- 0159US10886139B2Method of etching one or more of mixed metal and dielectric layers of a semiconductor deviceTESCAN BRNO S R O·Filed 2017·Granted Jan 5, 2021·2 cites·13 claims
- 0252US10832918B2Method for removal of matterTESCAN BRNO S R O·Filed 2018·Granted Nov 10, 2020·1 cites·8 claims
- 0352US10535496B2Device with ion column and scanning electron microscopeTESCAN BRNO S R O·Filed 2018·Granted Jan 14, 2020·0 cites·12 claims
- 0444US9721781B2Device for mass spectrometryTESCAN BRNO S R O·Filed 2016·Granted Aug 1, 2017·0 cites·9 claims
- 0537US11476080B2Device with at least one adjustable sample holder and method of changing holder tilt angle and method of preparing a lamellaTESCAN BRNO S R O·Filed 2019·Granted Oct 18, 2022·0 cites·17 claims
- 0637US10811216B2Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mappingTESCAN BRNO S R O·Filed 2019·Granted Oct 20, 2020·0 cites·12 claims
- 0737US10504694B2Scanning electron microscope and method of use thereofTESCAN BRNO S R O·Filed 2017·Granted Dec 10, 2019·0 cites·25 claims
- 0835US2023326708A1Tilting Element Of Manipulation StageTESCAN BRNO S R O·Filed 2021·Application pending·0 cites
- 0934US10636622B2Scanning transmission electron microscopeTESCAN BRNO S R O·Filed 2018·Granted Apr 28, 2020·0 cites·16 claims
- 1033US12288665B2Sample display methodTESCAN BRNO S R O·Filed 2021·Granted Apr 29, 2025·0 cites·3 claims
- 1133US2023215689A1Method of Automatic Detection of Required Peak for Sample Machining by Focused Ion BeamTESCAN BRNO S R O·Filed 2021·Application pending·0 cites
- 1232US10381193B2Scanning transmission electron microscope with an objective electromagnetic lens and a method of use thereofTESCAN BRNO S R O·Filed 2018·Granted Aug 13, 2019·0 cites·16 claims
- 1324US2021050180A1A Device for Extracting and Placing a LamellaTESCAN BRNO S R O·Filed 2019·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →