Assignee
TESEDA CORP
US·8 granted patents·37 citations·filing 2002–2019
Top patents by PatentIndex Score
8 records- 0184US8918753B2Correlation of device manufacturing defect data with device electrical test dataTESEDA CORP·Filed 2013·Granted Dec 23, 2014·4 cites·24 claims
- 0278US10768231B2Diagnosing failing scan chains in a semiconductor integrated circuitTESEDA CORP·Filed 2019·Granted Sep 8, 2020·2 cites·14 claims
- 0378US10247777B1Detecting and locating shoot-through timing failures in a semiconductor integrated circuitTESEDA CORP·Filed 2017·Granted Apr 2, 2019·2 cites·4 claims
- 0475US7036062B2Single board DFT integrated circuit testerTESEDA CORP·Filed 2002·Granted Apr 25, 2006·23 cites·16 claims
- 0558US9939488B2Field triage of EOS failures in semiconductor devicesTESEDA CORP·Filed 2014·Granted Apr 10, 2018·1 cites·9 claims
- 0650US8892972B2Scan chain fault diagnosisTESEDA CORP·Filed 2013·Granted Nov 18, 2014·0 cites·6 claims
- 0739US6925406B2Scan test viewing and analysis toolTESEDA CORP·Filed 2003·Granted Aug 2, 2005·2 cites·3 claims
- 0838US6956394B2Tester architecture for testing semiconductor integrated circuitsTESEDA CORP·Filed 2004·Granted Oct 18, 2005·3 cites·7 claims
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