Assignee
TEST ADVANTAGE INC
US·10 granted patents·1 pending application·322 citations·filing 2001–2011
Top patents by PatentIndex Score
11 records- 0194US7356430B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2005·Granted Apr 8, 2008·76 cites·19 claims
- 0290US6792373B2Methods and apparatus for semiconductor testingTEST ADVANTAGE INC·Filed 2002·Granted Sep 14, 2004·59 cites·20 claims
- 0387US7395170B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2004·Granted Jul 1, 2008·49 cites·45 claims
- 0486US7437271B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2005·Granted Oct 14, 2008·10 cites·51 claims
- 0585US7225107B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2003·Granted May 29, 2007·64 cites·38 claims
- 0683US8000928B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2008·Granted Aug 16, 2011·12 cites·45 claims
- 0781US7167811B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2003·Granted Jan 23, 2007·24 cites·47 claims
- 0874US8041541B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2007·Granted Oct 18, 2011·9 cites·38 claims
- 0968US6442499B1Methods and apparatus for statistical process control of testTEST ADVANTAGE INC·Filed 2001·Granted Aug 27, 2002·15 cites·19 claims
- 1065US7904279B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2007·Granted Mar 8, 2011·4 cites·21 claims
- 1132US2011178967A1Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2011·Application pending·0 cites
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