Assignee
TIMANS PAUL JANIS
US·7 granted patents·70 citations·filing 2006–2012
Top patents by PatentIndex Score
7 records- 0196US8296091B2System and process for calibrating pyrometers in thermal processing chambersTIMANS PAUL JANIS·Filed 2011·Granted Oct 23, 2012·17 cites·25 claims
- 0295US8668383B2Methods for determining wafer temperatureTIMANS PAUL JANIS·Filed 2012·Granted Mar 11, 2014·13 cites·18 claims
- 0389US8152365B2Method and system for determining optical properties of semiconductor wafersTIMANS PAUL JANIS·Filed 2006·Granted Apr 10, 2012·12 cites·19 claims
- 0488US8696197B2Method and system for determining optical properties of semiconductor wafersTIMANS PAUL JANIS·Filed 2012·Granted Apr 15, 2014·7 cites·12 claims
- 0588US8222570B2System and process for heating semiconductor wafers by optimizing absorption of electromagnetic energyTIMANS PAUL JANIS·Filed 2008·Granted Jul 17, 2012·8 cites·37 claims
- 0686US8669496B2System and process for heating semiconductor wafers by optimizing absorption of electromagnetic energyTIMANS PAUL JANIS·Filed 2012·Granted Mar 11, 2014·4 cites·12 claims
- 0780US8157439B2Methods for determining wafer temperatureTIMANS PAUL JANIS·Filed 2009·Granted Apr 17, 2012·9 cites·26 claims
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