Assignee
TOKYO CATHODE LAB
JP·3 granted patents·91 citations·filing 1990–2006
Top patents by PatentIndex Score
3 records- 0184US6573738B1Multi-layered probe for a probecardTOKYO CATHODE LAB·Filed 2000·Granted Jun 3, 2003·87 cites·6 claims
- 0245US7298155B2Probing apparatusTOKYO CATHODE LAB·Filed 2006·Granted Nov 20, 2007·3 cites·9 claims
- 0312US5138173ACharge detector for semiconductor substratesTOKYO CATHODE LAB·Filed 1990·Granted Aug 11, 1992·1 cites·4 claims
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