Assignee
TOKYO SEIMITSU ISRAEL LTD
JP·2 granted patents·1 pending application·39 citations·filing 2002–2002
Top patents by PatentIndex Score
3 records- 0177US7155052B2Method for pattern inspectionTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Granted Dec 26, 2006·32 cites·27 claims
- 0244US6603589B2Circular scanning patternsTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Granted Aug 5, 2003·7 cites·12 claims
- 0336US2003081826A1Tilted scan for Die-to-Die and Cell-to-Cell detectionTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Application pending·0 cites
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