Assignee
TOPCON CORP
JP·1,294 granted patents·283 pending applications·16,935 citations·filing 1987–2025
Top patents by PatentIndex Score
1,577 records- 0198US11257190B2Image quality improvement methods for optical coherence tomographyTOPCON CORP·Filed 2020·Granted Feb 22, 2022·31 cites·13 claims
- 0298US9201422B2Measuring systemTOPCON CORP·Filed 2015·Granted Dec 1, 2015·43 cites·6 claims
- 0397US11966508B2Survey systemTOPCON CORP·Filed 2022·Granted Apr 23, 2024·6 cites·6 claims
- 0497US11313680B2Positioning device, positioning method, and programTOPCON CORP·Filed 2020·Granted Apr 26, 2022·6 cites·5 claims
- 0597US7649920B2Q-switched microlaser apparatus and method for useTOPCON CORP·Filed 2007·Granted Jan 19, 2010·100 cites·25 claims
- 0696US11933611B2Target direction determining device, control system, and method and program for aiming surveying device at a targetTOPCON CORP·Filed 2021·Granted Mar 19, 2024·4 cites·6 claims
- 0796US11403826B2Management system and management method using eyewear deviceTOPCON CORP·Filed 2020·Granted Aug 2, 2022·4 cites·8 claims
- 0896US9053547B2Three-dimensional point cloud position data processing device, three-dimensional point cloud position data processing system, and three-dimensional point cloud position data processing method and programTOPCON CORP·Filed 2013·Granted Jun 9, 2015·34 cites·15 claims
- 0996US8045762B2Surveying method, surveying system and surveying data processing programTOPCON CORP·Filed 2007·Granted Oct 25, 2011·63 cites·18 claims
- 1096US7747151B2Image processing device and methodTOPCON CORP·Filed 2007·Granted Jun 29, 2010·54 cites·15 claims
- 1196USD552736SOphthalmic instrumentTOPCON CORP·Filed 2006·Granted Oct 9, 2007·105 cites·1 claims
- 1295US12152883B2Three-dimensional position measuring system, measuring method, and storage mediumTOPCON CORP·Filed 2022·Granted Nov 26, 2024·4 cites·8 claims
- 1395US11402506B2Laser measuring method and laser measuring instrumentTOPCON CORP·Filed 2018·Granted Aug 2, 2022·14 cites·14 claims
- 1495US11393169B2Photogrammetry of building using machine learning based inferenceTOPCON CORP·Filed 2021·Granted Jul 19, 2022·4 cites·30 claims
- 1595US10895456B1Three-dimensional survey apparatus, three-dimensional survey method, and three-dimensional survey programTOPCON CORP·Filed 2020·Granted Jan 19, 2021·6 cites·5 claims
- 1695US10478060B2Ophthalmic image processing apparatus and ophthalmic imaging apparatusTOPCON CORP·Filed 2017·Granted Nov 19, 2019·18 cites·10 claims
- 1795US7604351B2Optical image measurement device and optical image measurement methodTOPCON CORP·Filed 2008·Granted Oct 20, 2009·33 cites·17 claims
- 1895US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 1995US7319512B2Surveying instrumentTOPCON CORP·Filed 2005·Granted Jan 15, 2008·52 cites·8 claims
- 2095US5771978AGrading implement elevation controller with tracking station and reference laser beamTOPCON CORP·Filed 1996·Granted Jun 30, 1998·104 cites·21 claims
- 2195US2026069140A1Ophthalmic observation apparatusTOPCON CORP·Filed 2025·Application pending·0 cites
- 2294US12152880B2Surveying system, point cloud data acquiring method, and point cloud data acquiring programTOPCON CORP·Filed 2022·Granted Nov 26, 2024·2 cites·22 claims
- 2394US11536568B2Target instrument and surveying systemTOPCON CORP·Filed 2019·Granted Dec 27, 2022·11 cites·8 claims
- 2494US9897436B2Measuring instrument and surveying systemTOPCON CORP·Filed 2017·Granted Feb 20, 2018·8 cites·25 claims
- 2594US7474388B2Distance measuring deviceTOPCON CORP·Filed 2006·Granted Jan 6, 2009·76 cites·9 claims
- 2694US7345770B2Optical image measuring apparatus and optical image measuring method for forming a velocity distribution image expressing a moving velocity distribution of the moving matterTOPCON CORP·Filed 2005·Granted Mar 18, 2008·41 cites·50 claims
- 2794US7130035B2Target for surveying instrumentTOPCON CORP·Filed 2005·Granted Oct 31, 2006·44 cites·11 claims
- 2894US5485266ALaser beam survey instrument having a tiltable laser beam axis and tilt detectorsTOPCON CORP·Filed 1993·Granted Jan 16, 1996·130 cites·7 claims
- 2993US11808571B2Surveying system, staking assistance method, and storage medium storing staking assistance programTOPCON CORP·Filed 2021·Granted Nov 7, 2023·5 cites·6 claims
- 3093US11614415B2Nondestructive testing system and nondestructive testing methodTOPCON CORP·Filed 2020·Granted Mar 28, 2023·5 cites·20 claims
- 3193US11592291B2Method, device, and program for surveyingTOPCON CORP·Filed 2019·Granted Feb 28, 2023·10 cites·7 claims
- 3293US11132797B2Automatically identifying regions of interest of an object from horizontal images using a machine learning guided imaging systemTOPCON CORP·Filed 2018·Granted Sep 28, 2021·15 cites·17 claims
- 3393US9369697B2Measuring instrument for preparing three-dimensional point cloud modelTOPCON CORP·Filed 2014·Granted Jun 14, 2016·22 cites·7 claims
- 3493US7804996B2Method for associating stereo image and three-dimensional data preparation systemTOPCON CORP·Filed 2005·Granted Sep 28, 2010·41 cites·15 claims
- 3593US7626690B2Laser scannerTOPCON CORP·Filed 2007·Granted Dec 1, 2009·45 cites·8 claims
- 3693US7492466B2Optical image measuring apparatus and optical image measuring methodTOPCON CORP·Filed 2005·Granted Feb 17, 2009·35 cites·71 claims
- 3793USD585903SUser interface for ophthalmic instrumentTOPCON CORP·Filed 2006·Granted Feb 3, 2009·61 cites·1 claims
- 3893US7329867B2Electron beam system and electron beam measuring and observing methodsTOPCON CORP·Filed 2006·Granted Feb 12, 2008·20 cites·10 claims
- 3993US6852974B2Electron beam device and method for stereoscopic measurementsTOPCON CORP·Filed 2002·Granted Feb 8, 2005·40 cites·19 claims
- 4093US5226910ASurgical cutterTOPCON CORP·Filed 1992·Granted Jul 13, 1993·696 cites·3 claims
- 4192US10809360B2Laser scannerTOPCON CORP·Filed 2018·Granted Oct 20, 2020·9 cites·18 claims
- 4292US9073637B2Flying vehicle guiding system and flying vehicle guiding methodTOPCON CORP·Filed 2014·Granted Jul 7, 2015·19 cites·12 claims
- 4392US7860273B2Device and method for position measurementTOPCON CORP·Filed 2007·Granted Dec 28, 2010·36 cites·40 claims
- 4492US7844077B2Location measuring device and methodTOPCON CORP·Filed 2008·Granted Nov 30, 2010·25 cites·8 claims
- 4592US7206080B2Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatusTOPCON CORP·Filed 2002·Granted Apr 17, 2007·60 cites·12 claims
- 4692US5973772ALayout judgment apparatus and layout judgment systemTOPCON CORP·Filed 1997·Granted Oct 26, 1999·66 cites·17 claims
- 4791US11871994B2Ophthalmologic microscope and function expansion unitTOPCON CORP·Filed 2021·Granted Jan 16, 2024·2 cites·8 claims
- 4891US10520307B2Surveying instrumentTOPCON CORP·Filed 2017·Granted Dec 31, 2019·10 cites·7 claims
- 4991US7756311B2Optical image measuring device, optical image measuring program, fundus observation device, and fundus observation programTOPCON CORP·Filed 2006·Granted Jul 13, 2010·21 cites·32 claims
- 5091US7701566B2Surveying systemTOPCON CORP·Filed 2008·Granted Apr 20, 2010·31 cites·6 claims
Showing the top 50 of 1,577 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →