Assignee
TOPOMETRIX
US·6 granted patents·300 citations·filing 1992–1995
Top patents by PatentIndex Score
6 records- 0193US5455420AScanning probe microscope apparatus for use in a scanning electronTOPOMETRIX·Filed 1994·Granted Oct 3, 1995·101 cites·28 claims
- 0283US5507179ASynchronous sampling scanning force microscopeTOPOMETRIX·Filed 1994·Granted Apr 16, 1996·40 cites·57 claims
- 0382US5319960AScanning force microscopeTOPOMETRIX·Filed 1992·Granted Jun 14, 1994·59 cites·11 claims
- 0482US5291775AScanning force microscope with integrated optics and cantilever mountTOPOMETRIX·Filed 1992·Granted Mar 8, 1994·68 cites·16 claims
- 0560US5469734AScanning apparatus linearization and calibration systemTOPOMETRIX·Filed 1994·Granted Nov 28, 1995·18 cites·32 claims
- 0651US5641897AScanning apparatus linearization and calibration systemTOPOMETRIX·Filed 1995·Granted Jun 24, 1997·14 cites·18 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →