Assignee
TSEN ANDY
TW·4 granted patents·68 citations·filing 2009–2011
Top patents by PatentIndex Score
4 records- 0192US8229588B2Method and system for tuning advanced process control parametersTSEN ANDY·Filed 2009·Granted Jul 24, 2012·32 cites·17 claims
- 0292US8108060B2System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architectureTSEN ANDY·Filed 2009·Granted Jan 31, 2012·25 cites·19 claims
- 0384US8394719B2System and method for implementing multi-resolution advanced process controlTSEN ANDY·Filed 2011·Granted Mar 12, 2013·9 cites·20 claims
- 0464US8219341B2System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing modelTSEN ANDY·Filed 2009·Granted Jul 10, 2012·2 cites·14 claims
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