Assignee
UNIT PROCESS ASSEMBLIES
7 granted patents·89 citations·filing 1974–1978
Top patents by PatentIndex Score
7 records- 0181US4155009AThickness measurement instrument with memory storage of multiple calibrationsUNIT PROCESS ASSEMBLIES·Filed 1977·Granted May 15, 1979·37 cites·17 claims
- 0260US4079237ACard controlled beta backscatter thickness measuring instrumentUNIT PROCESS ASSEMBLIES·Filed 1975·Granted Mar 14, 1978·16 cites·2 claims
- 0352US4042880AElectrode assembly for measuring the effective thickness of thru-hole plating circuit board workpiecesUNIT PROCESS ASSEMBLIES·Filed 1974·Granted Aug 16, 1977·9 cites·1 claims
- 0450US4046994AControl card receiving and sensing assemblyUNIT PROCESS ASSEMBLIES·Filed 1975·Granted Sep 6, 1977·9 cites·10 claims
- 0546US4190770ABackscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Feb 26, 1980·9 cites·9 claims
- 0635US4115690ABackscatter instrument for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1977·Granted Sep 19, 1978·5 cites·4 claims
- 0733US4229652ABackscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate materialUNIT PROCESS ASSEMBLIES·Filed 1978·Granted Oct 21, 1980·4 cites·7 claims
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