Assignee
UNITED MICROELECTRONICS CORPS
US·2 granted patents·4 citations·filing 2000–2001
Top patents by PatentIndex Score
2 records- 0146US6495472B2Method for avoiding erosion of conductor structure during removing etching residuesUNITED MICROELECTRONICS CORPS·Filed 2001·Granted Dec 17, 2002·2 cites·4 claims
- 0239US6495417B1Method for increasing tolerance of contact extension alignment in COB DRAMUNITED MICROELECTRONICS CORPS·Filed 2000·Granted Dec 17, 2002·2 cites·21 claims
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