Assignee
UNITED SEMICONDUCTOR CIRCUIT C
TW·4 granted patents·44 citations·filing 1998–1998
Top patents by PatentIndex Score
4 records- 0158US6060367AMethod of forming capacitorsUNITED SEMICONDUCTOR CIRCUIT C·Filed 1998·Granted May 9, 2000·18 cites·11 claims
- 0240US5970364AMethod of nitride-sealed oxide-buffered local oxidation of siliconUNITED SEMICONDUCTOR CIRCUIT C·Filed 1998·Granted Oct 19, 1999·9 cites·12 claims
- 0338US5998286AMethod to grow self-aligned silicon on a poly-gate, source and drain regionUNITED SEMICONDUCTOR CIRCUIT C·Filed 1998·Granted Dec 7, 1999·7 cites·27 claims
- 0437US6046601AMethod for measuring the kink effect of a semiconductor deviceUNITED SEMICONDUCTOR CIRCUIT C·Filed 1998·Granted Apr 4, 2000·10 cites·1 claims
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