Assignee
UNITY SEMICONDUCTOR
FR·20 granted patents·3 pending applications·13 citations·filing 2015–2024
Top patents by PatentIndex Score
23 records- 0190US10082425B2Integrated chromatic confocal sensorUNITY SEMICONDUCTOR·Filed 2016·Granted Sep 25, 2018·6 cites·12 claims
- 0289US12074400B1Substrate dimension adapterUNITY SEMICONDUCTOR·Filed 2024·Granted Aug 27, 2024·3 cites·18 claims
- 0378US9857313B2Method and system for inspecting wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Jan 2, 2018·2 cites·13 claims
- 0475US12444039B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 14, 2025·0 cites·17 claims
- 0569US12079979B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Sep 3, 2024·0 cites·13 claims
- 0667US11906302B2Method and system for measuring a surface of an object comprising different structures using low coherence interferometryUNITY SEMICONDUCTOR·Filed 2023·Granted Feb 20, 2024·0 cites·14 claims
- 0766US11713960B2Method and system for measuring a surface of an object comprising different structures using low coherence interferometryUNITY SEMICONDUCTOR·Filed 2019·Granted Aug 1, 2023·1 cites·15 claims
- 0861US12123698B1Method and a system for characterizing structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 22, 2024·0 cites·15 claims
- 0960US10260868B2Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Apr 16, 2019·1 cites·11 claims
- 1058US11959736B2Method and a system for characterising structures etched in a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Apr 16, 2024·0 cites·15 claims
- 1157US12163899B2System for optical inspection of a substrate using same or different wavelengthsUNITY SEMICONDUCTOR·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
- 1254US11959737B2Method and a system for combined characterisation of structures etched in a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Apr 16, 2024·0 cites·13 claims
- 1354US11942379B1Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the methodUNITY SEMICONDUCTOR·Filed 2023·Granted Mar 26, 2024·0 cites·16 claims
- 1450US12196681B1Method and a device for detecting crystalline defects in a substrate by dark field and photoluminescenceUNITY SEMICONDUCTOR·Filed 2024·Granted Jan 14, 2025·0 cites·16 claims
- 1549US11300520B2Method and system for optically inspecting a substrateUNITY SEMICONDUCTOR·Filed 2018·Granted Apr 12, 2022·0 cites·15 claims
- 1648US12590905B2Method and system for discriminating defects present on a frontside from defects present on a backside of a transparent substrateUNITY SEMICONDUCTOR·Filed 2022·Granted Mar 31, 2026·0 cites·20 claims
- 1747US11965834B2Dark-field optical inspection deviceUNITY SEMICONDUCTOR·Filed 2019·Granted Apr 23, 2024·0 cites·18 claims
- 1843US11287246B2Method and device for inspecting a surface of an object comprising nonsimilar materialsUNITY SEMICONDUCTOR·Filed 2019·Granted Mar 29, 2022·0 cites·16 claims
- 1940US2021116694A1Lighting device for microscopeUNITY SEMICONDUCTOR·Filed 2019·Application pending·0 cites
- 2038US11092644B2Method and system for inspecting boards for microelectronics or optics by laser doppler effectUNITY SEMICONDUCTOR·Filed 2017·Granted Aug 17, 2021·0 cites·10 claims
- 2135US10684233B2Positioning device for an integrated circuit board, and inspection apparatus for an integrated circuit board comprising such a positioning deviceUNITY SEMICONDUCTOR·Filed 2017·Granted Jun 16, 2020·0 cites·14 claims
- 2231US2019137265A1Method and system for the optical inspection and measurement of a face of an objectUNITY SEMICONDUCTOR·Filed 2017·Application pending·0 cites
- 2330US2018364028A1Device and method for measuring height in the presence of thin layersUNITY SEMICONDUCTOR·Filed 2016·Application pending·0 cites
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