Assignee
URANO TAKAHIRO
JP·2 granted patents·1 pending application·13 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0187US9075026B2Defect inspection device and defect inspection methodURANO TAKAHIRO·Filed 2010·Granted Jul 7, 2015·11 cites·20 claims
- 0270US8908172B2Defect inspection device and method of inspecting defectURANO TAKAHIRO·Filed 2011·Granted Dec 9, 2014·2 cites·12 claims
- 0337US2013294677A1Defect inspection method and defect inspection deviceURANO TAKAHIRO·Filed 2011·Application pending·0 cites
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