Assignee
URANO YUTA
JP·9 granted patents·47 citations·filing 2008–2011
Top patents by PatentIndex Score
9 records- 0192US8922764B2Defect inspection method and defect inspection apparatusURANO YUTA·Filed 2011·Granted Dec 30, 2014·12 cites·12 claims
- 0287US8314929B2Method and its apparatus for inspecting defectsURANO YUTA·Filed 2011·Granted Nov 20, 2012·5 cites·6 claims
- 0387US8274652B2Defect inspection system and method of the sameURANO YUTA·Filed 2008·Granted Sep 25, 2012·11 cites·16 claims
- 0486US8599369B2Defect inspection device and inspection methodURANO YUTA·Filed 2010·Granted Dec 3, 2013·6 cites·15 claims
- 0581US8804110B2Fault inspection device and fault inspection methodURANO YUTA·Filed 2011·Granted Aug 12, 2014·4 cites·8 claims
- 0675US8477302B2Defect inspection apparatusURANO YUTA·Filed 2009·Granted Jul 2, 2013·4 cites·18 claims
- 0775US8427634B2Defect inspection method and apparatusURANO YUTA·Filed 2009·Granted Apr 23, 2013·3 cites·18 claims
- 0872US9588054B2Defect inspection method, low light detecting method and low light detectorURANO YUTA·Filed 2011·Granted Mar 7, 2017·2 cites·6 claims
- 0960US8748795B2Method for inspecting pattern defect and device for realizing the sameURANO YUTA·Filed 2008·Granted Jun 10, 2014·0 cites·14 claims
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