Assignee
UTO SACHIO
JP·5 granted patents·2 pending applications·6 citations·filing 2008–2012
Top patents by PatentIndex Score
7 records- 0180US8508727B2Defects inspecting apparatus and defects inspecting methodUTO SACHIO·Filed 2012·Granted Aug 13, 2013·2 cites·18 claims
- 0274US8149395B2Apparatus and method for inspecting patternUTO SACHIO·Filed 2011·Granted Apr 3, 2012·1 cites·13 claims
- 0371US8482728B2Apparatus and method for inspecting defect on object surfaceUTO SACHIO·Filed 2008·Granted Jul 9, 2013·3 cites·22 claims
- 0459US8451439B2Apparatus and method for inspecting patternUTO SACHIO·Filed 2012·Granted May 28, 2013·0 cites·13 claims
- 0559US8228495B2Defects inspecting apparatus and defects inspecting methodUTO SACHIO·Filed 2011·Granted Jul 24, 2012·0 cites·14 claims
- 0654US2011075134A1Defect Inspection Method and SystemUTO SACHIO·Filed 2010·Application pending·0 cites
- 0751US2011141272A1Apparatus and method for inspecting an object surface defectUTO SACHIO·Filed 2009·Application pending·0 cites
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