Assignee
VAEZ-IRAVANI MEHDI
US·4 granted patents·1 pending application·38 citations·filing 2005–2009
Top patents by PatentIndex Score
5 records- 0193US9068917B1Systems and methods for inspection of a specimenVAEZ-IRAVANI MEHDI·Filed 2006·Granted Jun 30, 2015·22 cites·23 claims
- 0289US8194240B1Enhanced focusing capability on a sample using a spot matrixVAEZ-IRAVANI MEHDI·Filed 2008·Granted Jun 5, 2012·11 cites·8 claims
- 0377US8283631B2In-situ differential spectroscopyVAEZ-IRAVANI MEHDI·Filed 2009·Granted Oct 9, 2012·4 cites·7 claims
- 0467US8817248B2Simultaneous multi-spot inspection and imagingVAEZ-IRAVANI MEHDI·Filed 2009·Granted Aug 26, 2014·1 cites·20 claims
- 0554US2005206886A1Sample inspection systemVAEZ-IRAVANI MEHDI·Filed 2005·Application pending·0 cites
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