Assignee
VALCORE JOHN
US·2 granted patents·2 pending applications·7 citations·filing 2009–2012
Top patents by PatentIndex Score
4 records- 0177US8508239B2Non-destructive signal propagation system and method to determine substrate integrityVALCORE JOHN·Filed 2009·Granted Aug 13, 2013·6 cites·18 claims
- 0257US8293023B2System and method for monitoring wafer stressVALCORE JOHN·Filed 2009·Granted Oct 23, 2012·1 cites·2 claims
- 0347US2011094546A1System and method for wafer carrier vibration reductionVALCORE JOHN·Filed 2009·Application pending·0 cites
- 0436US2014083463A1System and method for monitoring wafer stressVALCORE JOHN·Filed 2012·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →