Assignee
VAN DE PEUT TEUNIS
NL·3 granted patents·39 citations·filing 2011–2011
Top patents by PatentIndex Score
3 records- 0194US9691589B2Dual pass scanningVAN DE PEUT TEUNIS·Filed 2011·Granted Jun 27, 2017·11 cites·24 claims
- 0294US8598544B2Method of generating a two-level pattern for lithographic processing and pattern generator using the sameVAN DE PEUT TEUNIS·Filed 2011·Granted Dec 3, 2013·24 cites·28 claims
- 0376US8710465B2Pattern data conversion for lithography systemVAN DE PEUT TEUNIS·Filed 2011·Granted Apr 29, 2014·4 cites·62 claims
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