Assignee

VELDMAN ANDREI

US·2 granted patents·0 citations·filing 2008–2010

Technology mixG01N1 G02B1 G03F1 G06T1

Top patents by PatentIndex Score

2 records

0142US8760649B1Model-based metrology using tesselation-based discretizationVELDMAN ANDREI·Filed 2008·Granted Jun 24, 2014·0 cites·22 claims
0238US9523800B2Computation efficiency by iterative spatial harmonics order truncationVELDMAN ANDREI·Filed 2010·Granted Dec 20, 2016·0 cites·8 claims

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