Assignee
VIRGINIA SEMICONDUCTOR INC
US·8 granted patents·232 citations·filing 1995–2001
Top patents by PatentIndex Score
8 records- 0188US5754294AOptical micrometer for measuring thickness of transparent wafersVIRGINIA SEMICONDUCTOR INC·Filed 1996·Granted May 19, 1998·71 cites·22 claims
- 0284US5959731AOptical micrometer for measuring thickness of transparent substrates based on optical absorptionVIRGINIA SEMICONDUCTOR INC·Filed 1997·Granted Sep 28, 1999·48 cites·18 claims
- 0375US6080042AFlatness and throughput of single side polishing of wafersVIRGINIA SEMICONDUCTOR INC·Filed 1997·Granted Jun 27, 2000·45 cites·15 claims
- 0469US6057924AOptical system for measuring and inspecting partially transparent substratesVIRGINIA SEMICONDUCTOR INC·Filed 1998·Granted May 2, 2000·25 cites·14 claims
- 0562US5843832AMethod of formation of thin bonded ultra-thin wafersVIRGINIA SEMICONDUCTOR INC·Filed 1995·Granted Dec 1, 1998·35 cites·19 claims
- 0641US6554687B1Precise crystallographic-orientation alignment mark for a semiconductor waferVIRGINIA SEMICONDUCTOR INC·Filed 2001·Granted Apr 29, 2003·1 cites·20 claims
- 0737US6428618B2Method for forming a solid solution alloy crystalVIRGINIA SEMICONDUCTOR INC·Filed 2001·Granted Aug 6, 2002·1 cites·20 claims
- 0833US6159285AConverting <100> and <111> ingots to <110> ingotsVIRGINIA SEMICONDUCTOR INC·Filed 1999·Granted Dec 12, 2000·6 cites·25 claims
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