Assignee
WANG CHUNG-MING
TW·2 granted patents·0 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0140US8877598B2Method of lithography process with an under isolation material layerWANG CHUNG-MING·Filed 2012·Granted Nov 4, 2014·0 cites·20 claims
- 0239US8765363B2Method of forming a resist pattern with multiple post exposure baking stepsWANG CHUNG-MING·Filed 2012·Granted Jul 1, 2014·0 cites·20 claims
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