Assignee
WANG CHUNHAI
2 granted patents·6 citations·filing 2007–2012
Top patents by PatentIndex Score
2 records- 0170US7958776B2Atomic force gradient microscope and method of using this microscopeWANG CHUNHAI·Filed 2007·Granted Jun 14, 2011·6 cites·20 claims
- 0246US9279663B2Method and apparatus to fold optics in tools for measuring shape and/or thickness of a large and thin substrateWANG CHUNHAI·Filed 2012·Granted Mar 8, 2016·0 cites·20 claims
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